Electronics reliability and measurement technology : nondestructive evaluation /

Electronics reliability and measurement technology : nondestructive evaluation /

This book examines electronics reliability and measurement technology. It identifies advances in measurement science and technology for nondestructive evaluation, and it details common measurement trouble spots.

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Bibliographic Details
Main Author: Heyman, Joseph S. (Author)
Format: Software eBook
Language:English
Published: Park Ridge, N.J., U.S.A. Noyes Data Corpages c1988.
Subjects:
Integrated circuits > Reliability > Congresses.
Nondestructive testing > Congresses.
Integrated circuits > Testing > Congresses.
Electronic books.
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Description
Summary:This book examines electronics reliability and measurement technology. It identifies advances in measurement science and technology for nondestructive evaluation, and it details common measurement trouble spots.
Item Description:"The Electronics Reliability and Measurement Technology Workshop was held in June 1986 at NASA Langley Research Center"--Page vii.
Physical Description:1 CD-ROM 12 cm
Bibliography:Includes bibliographical references and index.
ISBN:1591240514 (electronic bk.)
9781591240518 (electronic bk.)
9780815516996 (electronic bk.)
0815516991 (electronic bk.)

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