Electronics reliability and measurement technology : nondestructive evaluation /
This book examines electronics reliability and measurement technology. It identifies advances in measurement science and technology for nondestructive evaluation, and it details common measurement trouble spots.
Saved in:
| Main Author: | |
|---|---|
| Format: | Software eBook |
| Language: | English |
| Published: |
Park Ridge, N.J., U.S.A.
Noyes Data Corpages
c1988.
|
| Subjects: | |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| LEADER | 01995nmm a2200421 i 4500 | ||
|---|---|---|---|
| 001 | vtls000107976 | ||
| 003 | MY-KaKUK | ||
| 005 | 20210816100948.0 | ||
| 007 | co cgu---unuuu | ||
| 008 | 140101s1988 nju fq d eng d | ||
| 020 | |a 1591240514 (electronic bk.) | ||
| 020 | |a 9781591240518 (electronic bk.) | ||
| 020 | |a 9780815516996 (electronic bk.) | ||
| 020 | |a 0815516991 (electronic bk.) | ||
| 035 | |a (OCoLC)ocn866987880 | ||
| 039 | 9 | |a 201401011724 |b SMT |c 201401011633 |d SMT |c 201308261708 |d HH |c 201308261651 |d HH |y 201302061639 |z AYAR | |
| 040 | |a MYPMP |b eng |e rda |c MYPMP | ||
| 090 | 0 | 0 | |a TK7874 |b E38 1988 |
| 100 | 1 | |a Heyman, Joseph S. |e author | |
| 245 | 0 | 0 | |a Electronics reliability and measurement technology : |b nondestructive evaluation / |c edited by Joseph S. Heyman. |
| 264 | 1 | |a Park Ridge, N.J., U.S.A. |b Noyes Data Corpages |c c1988. | |
| 300 | |a 1 CD-ROM |c 12 cm | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a computer disc |b cd |2 rdacarrier | ||
| 500 | |a "The Electronics Reliability and Measurement Technology Workshop was held in June 1986 at NASA Langley Research Center"--Page vii. | ||
| 504 | |a Includes bibliographical references and index. | ||
| 520 | |a This book examines electronics reliability and measurement technology. It identifies advances in measurement science and technology for nondestructive evaluation, and it details common measurement trouble spots. | ||
| 588 | |a Description based on print version record. | ||
| 650 | 0 | |a Integrated circuits |x Reliability |v Congresses. | |
| 650 | 0 | |a Nondestructive testing |v Congresses. | |
| 650 | 0 | |a Integrated circuits |x Testing |v Congresses. | |
| 655 | 4 | |a Electronic books. | |
| 700 | 1 | |a Heyman, Joseph S. | |
| 949 | |a VIRTUAITEM |d 30000 |f 1 |x 701 |6 701005001 |a TK7874 E38 1988 | ||
| 942 | |2 lcc |c COMPFILE | ||
| 999 | |c 97818 |d 97818 | ||
| 952 | |0 0 |1 0 |2 lcc |4 0 |6 TK7874 E38 01988 |7 0 |9 96771 |a PTSFP |b PTSFP |c 8 |d 2021-08-16 |l 0 |o TK7874 E38 1988 |p 701005001 |r 2021-08-16 |t 1 |w 2021-08-16 |y COMPFILE | ||