Electronics reliability and measurement technology : nondestructive evaluation /

This book examines electronics reliability and measurement technology. It identifies advances in measurement science and technology for nondestructive evaluation, and it details common measurement trouble spots.

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Bibliographic Details
Main Author: Heyman, Joseph S. (Author)
Format: Software eBook
Language:English
Published: Park Ridge, N.J., U.S.A. Noyes Data Corpages c1988.
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