Muhamad Nur Sadiq Sazali. (2017). An optimization of gate leakage in scaled MOSFET on the effect of temperature during the metal gate annealing process in Gate-Last Technology.
Chicago Style (17th ed.) CitationMuhamad Nur Sadiq Sazali. An Optimization of Gate Leakage in Scaled MOSFET on the Effect of Temperature During the Metal Gate Annealing Process in Gate-Last Technology. 2017.
MLA (8th ed.) CitationMuhamad Nur Sadiq Sazali. An Optimization of Gate Leakage in Scaled MOSFET on the Effect of Temperature During the Metal Gate Annealing Process in Gate-Last Technology. 2017.
Warning: These citations may not always be 100% accurate.