Thin film analysis by x-ray scattering

Thin film analysis by x-ray scattering

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Bibliographic Details
Main Author: Birkholz, Mario
Other Authors: Fewster, Paul F., Genzel, Christoph
Format: Book
Language:English
Published: Weinheim Wiley-VCH 2006
Subjects:
Thin films
X-ray spectroscopy
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Perpustakaan Laman Hikmah Kampus Induk, UTeM: Open Shelf

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Call Number: QC176 83 B57 2006
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