APA (7th ed.) Citation

Auciello, O., & Krauss, A. R. (2001). In situ real-time characterization of thin films. John Wiley & Sons.

Chicago Style (17th ed.) Citation

Auciello, Orlando, and Alan R. Krauss. In Situ Real-time Characterization of Thin Films. New York, NY: John Wiley & Sons, 2001.

MLA (8th ed.) Citation

Auciello, Orlando, and Alan R. Krauss. In Situ Real-time Characterization of Thin Films. John Wiley & Sons, 2001.