APA (7th ed.) Citation

Strong, A. W. (2009). Reliability wearout mechanisms in advanced CMOS technologies. IEEE Press/John Wiley & Sons.

Chicago Style (17th ed.) Citation

Strong, Alvin W. Reliability Wearout Mechanisms in Advanced CMOS Technologies. Piscataway, NJ: IEEE Press/John Wiley & Sons, 2009.

MLA (8th ed.) Citation

Strong, Alvin W. Reliability Wearout Mechanisms in Advanced CMOS Technologies. IEEE Press/John Wiley & Sons, 2009.

Warning: These citations may not always be 100% accurate.