Reliability wearout mechanisms in advanced CMOS technologies
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| Other Authors: | |
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| Format: | Book |
| Published: |
Piscataway, NJ
IEEE Press/John Wiley & Sons
2009
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| Series: | IEEE Press series on microelectronic systems
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| Subjects: | |
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| 245 | 0 | 0 | |a Reliability wearout mechanisms in advanced CMOS technologies |c /Alvin W. Strong ... [et al.] |
| 260 | |a Piscataway, NJ |b IEEE Press/John Wiley & Sons |c 2009 | ||
| 300 | |a xv, 624 p. |b ill. |c 24 cm | ||
| 490 | 0 | |a IEEE Press series on microelectronic systems | |
| 650 | 0 | |a Metal oxide semiconductors, Complementary |x Reliability |9 39928 | |
| 700 | 1 | |a Strong, Alvin W. |9 39929 | |
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