Reliability of nanoscale circuits and systems methodologies and circuit architectures

Reliability of nanoscale circuits and systems methodologies and circuit architectures

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Bibliographic Details
Main Author:	Stanisavljevic, Milos
Other Authors:	Schmid, Alexandre, Leblebici, Yusuf
Format:	Book
Language:	English
Published:	New York, NY Springer 2011
Subjects:	Nanoelectromechanical systems > Reliability Nanoelectronics
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