Reliability of nanoscale circuits and systems methodologies and circuit architectures

Reliability of nanoscale circuits and systems methodologies and circuit architectures

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Bibliographic Details
Main Author: Stanisavljevic, Milos
Other Authors: Schmid, Alexandre, Leblebici, Yusuf
Format: Book
Language:English
Published: New York, NY Springer 2011
Subjects:
Nanoelectromechanical systems > Reliability
Nanoelectronics
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Reliability of nanoscale circuits and systems methodologies and circuit architectures
by Stanisavljevic, Milos
Published 2011
Book
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