Nanophotonics, nanostructure, and nanometrology II 12-14 November 2007, Beijing, China

Nanophotonics, nanostructure, and nanometrology II 12-14 November 2007, Beijing, China

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Bibliographic Details
Corporate Author:	Society of Photo-optical Instrumentation Engineers
Other Authors:	Zhu, Xing, Chou, Stephen Y., Arakawa, Yasuhiko
Format:	Book
Published:	Bellingham, WA SPIE 2008
Series:	Proceedings of SPIE v. 6831
Subjects:	Nanostructured materials > Optical properties > Congresses Photonics > Congresses Metrology > Congresses
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