Nanophotonics, nanostructure, and nanometrology II 12-14 November 2007, Beijing, China

Nanophotonics, nanostructure, and nanometrology II 12-14 November 2007, Beijing, China

Show other versions (1)
Saved in:
Bibliographic Details
Corporate Author: Society of Photo-optical Instrumentation Engineers
Other Authors: Zhu, Xing, Chou, Stephen Y., Arakawa, Yasuhiko
Format: Book
Published: Bellingham, WA SPIE 2008
Series:Proceedings of SPIE v. 6831
Subjects:
Nanostructured materials > Optical properties > Congresses
Photonics > Congresses
Metrology > Congresses
Tags: Add Tag
No Tags, Be the first to tag this record!
Be the first to leave a comment!
You must be logged in first

Similar Items