Built-in-self-test and digital self-calibration for RF SoCs
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| Main Author: | |
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| Other Authors: | |
| Format: | Book |
| Language: | English |
| Published: |
New York, NY
Springer
2012
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| Series: | Springer briefs in electrical and computer engineering
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| Subjects: | |
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| Physical Description: | xvii, 89 p. ill. 24 cm |
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| ISBN: | 9781441995476 |