Built-in-self-test and digital self-calibration for RF SoCs
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| Main Author: | |
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| Format: | Book |
| Language: | English |
| Published: |
New York, NY
Springer
2012
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| Series: | Springer briefs in electrical and computer engineering
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| Subjects: | |
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Perpustakaan Laman Hikmah Kampus Induk, UTeM: Open Shelf
| Call Number: |
TK6561 B68 2012 |
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| Copy Unknown | Available Place a Hold |