Testing and testable design of high-density random-access memories
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| Main Author: | |
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| Other Authors: | |
| Format: | Book |
| Published: |
Boston, MA
Kluwer Academic Pub.
1996
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| Series: | Frontiers in electronic testing
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| Subjects: | |
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| Physical Description: | xxxviii, 386 p. ill. 24 cm |
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| ISBN: | 0792397827 |