Testing and testable design of high-density random-access memories
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| Format: | Livre |
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Boston, MA
Kluwer Academic Pub.
1996
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| Collection: | Frontiers in electronic testing
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| 100 | 1 | |a Mazumder, Pinaki |9 10808 | |
| 245 | 1 | 0 | |a Testing and testable design of high-density random-access memories |c /Pinaki Mazumder, Kanad Chakraborty |
| 260 | |a Boston, MA |b Kluwer Academic Pub. |c 1996 | ||
| 300 | |a xxxviii, 386 p. |b ill. |c 24 cm | ||
| 440 | 0 | |a Frontiers in electronic testing |9 12337 | |
| 650 | 0 | |a Random access memory |x Testing |9 12412 | |
| 700 | 1 | |a Chakraborty, Kanad |9 12413 | |
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