Testing and testable design of high-density random-access memories

Testing and testable design of high-density random-access memories

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Bibliografski detalji
Glavni autor:	Mazumder, Pinaki
Daljnji autori:	Chakraborty, Kanad
Format:	Knjiga
Izdano:	Boston, MA Kluwer Academic Pub. 1996
Serija:	Frontiers in electronic testing
Teme:	Random access memory > Testing
Oznake:	Dodaj oznaku Bez oznaka, Budi prvi tko označuje ovaj zapis!

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