Testing and testable design of high-density random-access memories

Testing and testable design of high-density random-access memories

Pokaż inne wersje (3)

Zapisane w:

Opis bibliograficzny
1. autor:	Mazumder, Pinaki
Kolejni autorzy:	Chakraborty, Kanad
Format:	Książka
Wydane:	Boston, MA Kluwer Academic Pub. 1996
Seria:	Frontiers in electronic testing
Hasła przedmiotowe:	Random access memory > Testing
Etykiety:	Dodaj etykietę Nie ma etykietki, Dołącz pierwszą etykiete!

Podobne zapisy

Testing and testable design of high-density random-access memories
od: Mazumder, Pinaki
Wydane: (1996)

Testing and testable design of high-density random-access memories /
od: Mazumder, Pinaki
Wydane: (1996)

Testing and testable design of high-density random-access memories /
od: Mazumder, Pinaki
Wydane: (1996)

Advanced test methods for SRAMs : effective solutions for dynamic fault detection in nanoscaled technologies /
Wydane: (2010)

Fabrication and characterization of engineered tunnel barrier for nonvolatile memory application /
od: Zarimawaty Zailan
Wydane: (2012)

Fabrication and characterization of engineered tunnel barrier for nonvolatile memory application /
od: Zarimawaty Zailan
Wydane: (2012)

Nanometer variation-tolerant SRAM : circuits and statistical design for yield /
od: Abu-Rahma, Mohamed H.
Wydane: (2013)

DRAM circuit design : fundamentals and high-speed topics /
Wydane: (2008)

DRAM circuit design : fundamental and high-speed topics /
Wydane: (2008)

Logic non-volatile memory : the NVM solutions from eMemory /
Wydane: (2014)

DRAM circuit design : fundamental and high-speed topics /
Wydane: (2008)

DRAM circuit design : a tutorial /
od: Keeth, Brent
Wydane: (2001)

DRAM circuit design : a tutorial /
od: Keeth, Brent., 1960-

Dynamic RAM technology advancements
od: Siddiqi, Muzaffer A.
Wydane: (2013)

Dynamic RAM technology advancements
od: Siddiqi, Muzaffer A.
Wydane: (2013)

Robust SRAM designs and analysis /
od: Singh, Jawar
Wydane: (2012)

CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test /
od: Pavlov, Andrei
Wydane: (2008)

Top 50 memory methods and tests /
od: Dansel, Michael
Wydane: (2007)

Practical PRAM programming /
od: Keller, Jorg
Wydane: (2001)

CMOS processors and memories /
Wydane: (2010)

Magnetic memory : fundamentals and technology /
od: Tang, Denny D.
Wydane: (2010)

Flash memories
Wydane: (1999)

Flash memories
Wydane: (1999)

Nonvolatile memory design : magnetic, resistive, and phase change /
od: Li, Hai
Wydane: (2012)

Nonvolatile memory technologies with emphasis on flash : a comprehensive guide to understanding and using NVM devices /
Wydane: (2008)

Development of FAT32-based data logging system using secure digital card memory /
od: Suria Affendi Amirrudin
Wydane: (2008)

High performance memory testing : design principles, fault modeling, and self-test /
od: Adams, R. Dean
Wydane: (2003)

Memory mass storage
Wydane: (2011)

Memory mass storage
Wydane: (2011)

Nonvolatile memory technologies with emphasis on flash : a comprehensive guide to understanding and using NVM devices /
Wydane: (2008)

Nonvolatile memory design : magnetic, resistive, and phase change /
od: Li, Hai
Wydane: (2012)

Nonvolatile memory design magnetic, resistive and phase change
od: Li, Hai
Wydane: (2012)

Nonvolatile memory design magnetic, resistive and phase change
od: Li, Hai
Wydane: (2012)

Memory mass storage /
Wydane: (2011)

Silicon non-volatile memories : paths of innovation /
od: De Salvo, Barbara

USB flash memory data transfer /
od: Khairul Nizam Mohamadiah
Wydane: (2006)

101 ways to improve your memory.
Wydane: (2005)

Random vibrations : theory and practice /
od: Wirsching, Paul H.
Wydane: (1995)

Silicon non-volatile memories paths of innovation
od: De Salvo, Barbara
Wydane: (2009)

Silicon non-volatile memories paths of innovation
od: De Salvo, Barbara
Wydane: (2009)