The impact of Gate-Induced Drain Leakage (GIDL) on scaled MOSFET for low power application

The impact of Gate-Induced Drain Leakage (GIDL) on scaled MOSFET for low power application

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Bibliographic Details
Main Author: Thailis Bounya Ngelayang
Corporate Author: Universiti Teknikal Malaysia Melaka. Faculty of Electronics and Computer Engineering
Format: Thesis Book
Language:English
Published: 2013
Subjects:
Electrical engineering
Low voltage integrated circuits > Design and construction
Metal oxide semiconductor field-effect transistors
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