Carrie, W. S. S. (2015). Planned yield, time yield and simple yield methods to calculate OEE metric in semiconductor company.
Chicago Style (17th ed.) CitationCarrie, Wong Siaw Shien. Planned Yield, Time Yield and Simple Yield Methods to Calculate OEE Metric in Semiconductor Company. 2015.
MLA (8th ed.) CitationCarrie, Wong Siaw Shien. Planned Yield, Time Yield and Simple Yield Methods to Calculate OEE Metric in Semiconductor Company. 2015.
Warning: These citations may not always be 100% accurate.