Wong, M. L. P. (2016). Design and analysis of electrical testing probe for semiconductor integrated circuit.
Cita Chicago (17th ed.)Wong, Michael Loke Peng. Design and Analysis of Electrical Testing Probe for Semiconductor Integrated Circuit. 2016.
Cita MLA (8th ed.)Wong, Michael Loke Peng. Design and Analysis of Electrical Testing Probe for Semiconductor Integrated Circuit. 2016.
Atenció: Aquestes cites poden no estar 100% correctes.