Design and analysis of electrical testing probe for semiconductor integrated circuit
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| Autor principal: | |
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| Autor corporatiu: | |
| Format: | Thesis Llibre |
| Idioma: | English |
| Publicat: |
2016
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| Matèries: | |
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| LEADER | 01404pam a2200313 4500 | ||
|---|---|---|---|
| 001 | 0000105445 | ||
| 008 | 170905s2016 my eng | ||
| 020 | |c gift | ||
| 040 | |a UTeM |b eng |e rda | ||
| 090 | 0 | 0 | |a TK7878.6 |b .W63 2016 |
| 100 | 1 | |a Wong, Michael Loke Peng |e author. |9 49118 | |
| 245 | 1 | 0 | |a Design and analysis of electrical testing probe for semiconductor integrated circuit |c /Michael Wong Loke Peng. |
| 264 | 1 | |c 2016 | |
| 300 | |a xiv, 68 pages |b some colour illustrations, charts, photographs |c 30 cm | ||
| 336 | |a still image |2 rdacontent | ||
| 336 | |a text |2 rdacontent | ||
| 337 | |a unmediated |2 rdamedia | ||
| 338 | |a volume |2 rdacarrier | ||
| 502 | |a Thesis (Master of Manufacturing Engineering : Manufacturing Systems Engineering) |c Universiti Teknikal Malaysia Melaka |d 2016 | ||
| 504 | |a Reference : pages 65-66. | ||
| 506 | 1 | |a Restricted until 3 May 2021. | |
| 650 | 0 | |a Electric apparatus and appliances |x Maintenance and repair. |9 10856 | |
| 650 | 0 | |a Probes (Electronic instruments). |9 49119 | |
| 650 | 0 | |a Semiconductors. |9 4909 | |
| 710 | 2 | |a Universiti Teknikal Malaysia Melaka. |b Faculty of Manufacturing Engineering |e institution |9 235 | |
| 998 | 0 | 0 | |a hrl/081117 |
| 999 | |c 104917 |d 104917 | ||
| 997 | |a FKP | ||
| 952 | |0 0 |1 0 |2 lcc |4 0 |6 TK7878 00006 W63 02016 |7 0 |9 130777 |a PLHKI |b PLHKI |c Archives |d 2019-02-26 |e UTEM |g 0.00 |l 0 |o TK7878 6 W63 2016 |p 0000130730 |r 2017-11-29 |s 2017-11-29 |w 2019-02-26 |y THM - A | ||