Design and analysis of electrical testing probe for semiconductor integrated circuit

Design and analysis of electrical testing probe for semiconductor integrated circuit

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Bibliografske podrobnosti
Glavni avtor: Wong, Michael Loke Peng (Author)
Korporativna značnica: Universiti Teknikal Malaysia Melaka. Faculty of Manufacturing Engineering (institution)
Format: Thesis Knjiga
Jezik:English
Izdano: 2016
Teme:
Electric apparatus and appliances > Maintenance and repair.
Probes (Electronic instruments).
Semiconductors.
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