Measurement techniques for radio frequency nanoelectronics /

Measurement techniques for radio frequency nanoelectronics /

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Bibliographic Details
Main Authors: Wallis, T. Mitch (Author), Kabos, Pavel (Author)
Format: Book
Language:English
Published: Cambridge : Cambridge University Press, 2017.
Series:The Cambridge RF and microwave engineering series
Subjects:
Radio frequency > Measurement.
Nanoelectronics.
Radio frequency microelectromechanical systems.
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LEADER 01557pam a2200409 i 4500
001 114265
003 UTeM
005 20190830102134.0
008 190830t20172017enk||||| |||| 00| 0 eng d
999 |c 114265  |d 114265 
010 |a 2017032744 
020 |a 9781107120686  |c RM385.19  |q hardcover 
040 |a DLC  |b eng  |c UTeM  |e rda 
050 0 0 |a TK6552.5  |b .W35 2017 
090 0 0 |a TK6552.5  |b .W34 2017 
100 1 |a Wallis, T. Mitch,  |e author.  |9 6730 
245 |a Measurement techniques for radio frequency nanoelectronics /  |c T. Mitch Wallis, Pavel Kabos. 
264 1 |a Cambridge :  |b Cambridge University Press,  |c 2017. 
264 4 |c ©2017 
300 |a xiv, 314 pages :  |b illustrations, charts, photographs ;  |c 25 cm. 
336 |a text  |2 rdacontent 
336 |a still image  |2 rdacontent 
337 |a unmediated  |2 rdamedia 
338 |a volume  |2 rdacarrier 
490 1 |a The Cambridge RF and microwave engineering series 
500 |a Index : pages 307-314. 
504 |a Includes bibliographical references. 
593 |a Requested by Win Adiyansyah Indra 
650 0 |a Radio frequency  |x Measurement.  |9 8698 
650 0 |a Nanoelectronics.  |9 8699 
650 0 |a Radio frequency microelectromechanical systems.  |9 8700 
700 1 |a Kabos, Pavel,  |e author.  |9 8701 
830 0 |a The Cambridge RF and microwave engineering series  |9 8702 
942 |2 lcc  |c BOK - OS  |k os 
997 |a FTKEE 
998 0 0 |a msr/300819 
952 |0 0  |1 0  |2 lcc  |4 0  |6 TK65525 W34 02017  |7 0  |9 142012  |a PLHKT  |b PLHKT  |c 8  |d 2019-08-30  |g 0.00  |o TK6552.5 .W34 2017  |p 87502668  |r 2019-08-30  |w 2019-08-30  |y BOK - OS 

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