X-ray metrology in semiconductor manufacturing /

X-ray metrology in semiconductor manufacturing /

Show other versions (3)
Saved in:
Bibliographic Details
Main Author: Bowen, D. Keith (Author)
Other Authors: Tanner, Brian K.
Format: Book
Language:English
Published: Boca Raton, FL : Taylor and Francis, 2006.
Subjects:
Semiconductors > Design and construction > Quality control.
Integrated circuits > Measurement.
Semiconductor wafers > Inspection.
X-rays > Diffraction.
Tags: Add Tag
No Tags, Be the first to tag this record!
Search Result 1
X-ray metrology in semiconductor manufacturing /
by Bowen, D. Keith
Published 2006
Book
Save to List
Saved in:
Search Result 2
X-ray metrology in semiconductor manufacturing
by Bowen, D. Keith
Published 2006
Book
Save to List
Saved in:
Search Result 3
X-ray metrology in semiconductor manufacturing
by Bowen, D. Keith
Published 2006
Book
Save to List
Saved in:
Show all versions (4)

Similar Items