Digital communications test and measurement : high-speed physical layer characterization /

Saved in:
Bibliographic Details
Other Authors: Derickson, Dennis, Muller, Marcus
Format: Book
Language:English
Published: Upper Saddle River, NJ : Pearson, 2008.
Series:Prentice Hall modern semiconductor design series
Subjects:
Tags: Add Tag
No Tags, Be the first to tag this record!