Reliability wearout mechanisms in advanced CMOS technologies
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| Other Authors: | |
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| Format: | Book |
| Published: |
Piscataway, NJ
IEEE Press/John Wiley & Sons
2009
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| Series: | IEEE Press series on microelectronic systems
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| Subjects: | |
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| Physical Description: | xv, 624 p. ill. 24 cm |
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| ISBN: | 9780471731726 |