Diffraction 39 X-rays 39 Measurement 12 Optical properties 11 Powders 9 X-ray crystallography 6 Crystallography 4 Design and construction 4 Industrial applications 4 Inspection 4 Integrated circuits 4 Quality control 4 Semiconductor wafers 4 Semiconductors 4 Thin films 4 Nanostructured materials 3 Scattering 3 Electrolytes 2 Experiments 2 Fluroscopy 2 Rayons X 2 Rietveld method 2 Technique 2 Voltammetry 2 X-ray diffractometer 2 Asymptotic expansions 1 Atom-probe field ion microscopy 1 Data processing 1 Difraction 1 Eigenfunctions 1