Handbook of instrumentation and techniques for semiconductor nanostructure characterization /

Handbook of instrumentation and techniques for semiconductor nanostructure characterization /

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Bibliografske podrobnosti
Drugi avtorji: Haight, Richard, Ross, Frances M., Hannon, James B.
Format: Knjiga
Jezik:English
Izdano: New Jersey World Scientific 2012.
Serija:World Scientific series in materials and energy 1-2.
Teme:
Nanostructured materials.
Nanoelectromechanical systems > Testing
Electron microscopy.
X-rays > Diffraction.
Atom-probe field ion microscopy.
Nanostructures > Handbooks, manuals, etc.
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