Infrared ellipsometry on semiconductor layer structures phonons, plasmons, and polaritons /

Infrared ellipsometry on semiconductor layer structures phonons, plasmons, and polaritons /

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Bibliografiske detaljer
Hovedforfatter:	Schubert, Mathias (Author)
Institution som forfatter:	SpringerLink (Online service)
Format:	eBog
Sprog:	English
Udgivet:	Berlin, Heidelberg Springer 2005.
Serier:	Springer Tracts in Modern Physics, 209
Fag:	Engineering Optical materials Physical optics Surfaces (Physics) Chemistry
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