Infrared ellipsometry on semiconductor layer structures phonons, plasmons, and polaritons /

Infrared ellipsometry on semiconductor layer structures phonons, plasmons, and polaritons /

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Détails bibliographiques
Auteur principal:	Schubert, Mathias (Auteur)
Collectivité auteur:	SpringerLink (Online service)
Format:	eBook
Langue:	English
Publié:	Berlin, Heidelberg Springer 2005.
Collection:	Springer Tracts in Modern Physics, 209
Sujets:	Engineering Optical materials Physical optics Surfaces (Physics) Chemistry
Accès en ligne:	Click here to view the full text content
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