Infrared ellipsometry on semiconductor layer structures phonons, plasmons, and polaritons /

Infrared ellipsometry on semiconductor layer structures phonons, plasmons, and polaritons /

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Sonraí bibleagrafaíochta
Príomhchruthaitheoir:	Schubert, Mathias (Údar)
Údar corparáideach:	SpringerLink (Online service)
Formáid:	Ríomhleabhar
Teanga:	English
Foilsithe / Cruthaithe:	Berlin, Heidelberg Springer 2005.
Sraith:	Springer Tracts in Modern Physics, 209
Ábhair:	Engineering Optical materials Physical optics Surfaces (Physics) Chemistry
Rochtain ar líne:	Click here to view the full text content
Clibeanna:	Cuir clib leis Níl clibeanna ann, Bí ar an gcéad duine le clib a chur leis an taifead seo!

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