Infrared ellipsometry on semiconductor layer structures phonons, plasmons, and polaritons /
Gardado en:
Autor Principal: | Schubert, Mathias (Author) |
---|---|
Autor Corporativo: | SpringerLink (Online service) |
Formato: | eBook |
Idioma: | English |
Publicado: |
Berlin, Heidelberg
Springer
2005.
|
Series: | Springer Tracts in Modern Physics,
209 |
Subjects: | |
Acceso en liña: | Click here to view the full text content |
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