Infrared ellipsometry on semiconductor layer structures phonons, plasmons, and polaritons /

Infrared ellipsometry on semiconductor layer structures phonons, plasmons, and polaritons /

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Bibliografski detalji
Glavni autor:	Schubert, Mathias (Autor)
Autor kompanije:	SpringerLink (Online service)
Format:	e-knjiga
Jezik:	English
Izdano:	Berlin, Heidelberg Springer 2005.
Serija:	Springer Tracts in Modern Physics, 209
Teme:	Engineering Optical materials Physical optics Surfaces (Physics) Chemistry
Online pristup:	Click here to view the full text content
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