Infrared ellipsometry on semiconductor layer structures phonons, plasmons, and polaritons /

Infrared ellipsometry on semiconductor layer structures phonons, plasmons, and polaritons /

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書誌詳細
第一著者:	Schubert, Mathias (著者)
団体著者:	SpringerLink (Online service)
フォーマット:	eBook
言語:	English
出版事項:	Berlin, Heidelberg Springer 2005.
シリーズ:	Springer Tracts in Modern Physics, 209
主題:	Engineering Optical materials Physical optics Surfaces (Physics) Chemistry
オンライン･アクセス:	Click here to view the full text content
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