Infrared ellipsometry on semiconductor layer structures phonons, plasmons, and polaritons /

Infrared ellipsometry on semiconductor layer structures phonons, plasmons, and polaritons /

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Главный автор:	Schubert, Mathias (Автор)
Соавтор:	SpringerLink (Online service)
Формат:	eКнига
Язык:	English
Опубликовано:	Berlin, Heidelberg Springer 2005.
Серии:	Springer Tracts in Modern Physics, 209
Предметы:	Engineering Optical materials Physical optics Surfaces (Physics) Chemistry
Online-ссылка:	Click here to view the full text content
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