Infrared ellipsometry on semiconductor layer structures phonons, plasmons, and polaritons /

Infrared ellipsometry on semiconductor layer structures phonons, plasmons, and polaritons /

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Bibliografske podrobnosti
Glavni avtor:	Schubert, Mathias (Author)
Korporativna značnica:	SpringerLink (Online service)
Format:	eKnjiga
Jezik:	English
Izdano:	Berlin, Heidelberg Springer 2005.
Serija:	Springer Tracts in Modern Physics, 209
Teme:	Engineering Optical materials Physical optics Surfaces (Physics) Chemistry
Online dostop:	Click here to view the full text content
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