Infrared ellipsometry on semiconductor layer structures phonons, plasmons, and polaritons /

Infrared ellipsometry on semiconductor layer structures phonons, plasmons, and polaritons /

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书目详细资料
主要作者:	Schubert, Mathias (Author)
企业作者:	SpringerLink (Online service)
格式:	电子书
语言:	English
出版:	Berlin, Heidelberg Springer 2005.
丛编:	Springer Tracts in Modern Physics, 209
主题:	Engineering Optical materials Physical optics Surfaces (Physics) Chemistry
在线阅读:	Click here to view the full text content
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