Structural, syntactic, and statistical pattern recognition joint IAPR international workshop, SSPR&SPR 2010, Cesme, Izmir, Turkey, August 18-20, 2010. Proceedings /
Kaydedildi:
Müşterek Yazar: | SpringerLink (Online service) |
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Diğer Yazarlar: | Hancock, Edwin R. |
Materyal Türü: | Ekitap |
Dil: | English |
Baskı/Yayın Bilgisi: |
Berlin, Heidelberg
Springer
2010.
|
Seri Bilgileri: | Lecture Notes in Computer Science,
6218 |
Konular: | |
Online Erişim: | Click here to view the full text contentu |
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