Atomic force microscopy based nanorobotics modelling, simulation, setup building and experiments /
<p>The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s. </p><p>There have been many progress on modeling, imaging, teleoperated o...
Saved in:
Main Author: | |
---|---|
Corporate Author: | |
Other Authors: | , , |
Format: | eBook |
Language: | English |
Published: |
Berlin, Heidelberg
Springer Berlin Heidelberg
2012.
|
Series: | Springer Tracts in Advanced Robotics
71 |
Subjects: | |
Online Access: | Click here to view the full text content |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
System Under Maintenance
Our Library Management System is currently under maintenance.
Holdings and item availability information is currently unavailable. Please accept our apologies for any inconvenience this may cause and contact us for further assistance: