Atomic force microscopy based nanorobotics modelling, simulation, setup building and experiments /

<p>The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s. </p><p>There have been many progress on modeling, imaging, teleoperated o...

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Bibliographic Details
Main Author: Xie, Hui (Author)
Corporate Author: SpringerLink (Online service)
Other Authors: Onal, Cagdas, Regnier, Stephane, Sitti, Metin
Format: eBook
Language:English
Published: Berlin, Heidelberg Springer Berlin Heidelberg 2012.
Series:Springer Tracts in Advanced Robotics 71
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