Fault analysis in cryptography /
<p>In the 1970s researchers noticed that radioactive particles produced by elements naturally present in packaging material could cause bits to flip in sensitive areas of electronic chips. Research into the effect of cosmic rays on semiconductors, an area of particular interest in the aerospac...
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Corporate Author: | SpringerLink (Online service) |
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Other Authors: | Tunstall, Michael, Joye, Marc |
Format: | eBook |
Language: | English |
Published: |
Berlin, Heidelberg
Springer Berlin Heidelberg
2012.
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Series: | Information Security and Cryptography
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Subjects: | |
Online Access: | Click here to view the full text content |
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