Fault analysis in cryptography /

<p>In the 1970s researchers noticed that radioactive particles produced by elements naturally present in packaging material could cause bits to flip in sensitive areas of electronic chips. Research into the effect of cosmic rays on semiconductors, an area of particular interest in the aerospac...

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Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Tunstall, Michael, Joye, Marc
Format: eBook
Language:English
Published: Berlin, Heidelberg Springer Berlin Heidelberg 2012.
Series:Information Security and Cryptography
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