Atom probe microscopy /

<p>Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors...

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主要作者: Gault, Baptiste (Author)
企业作者: SpringerLink (Online service)
其他作者: Moody, Michael P., Cairney, Julie M., Ringer, Simon P.
格式: 电子书
语言:English
出版: New York, NY Springer New York 2012.
丛编:Springer Series in Materials Science 160
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