Atom probe microscopy /
<p>Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors...
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| Materyal Türü: | Ekitap |
| Dil: | English |
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New York, NY
Springer New York
2012.
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| Seri Bilgileri: | Springer Series in Materials Science
160 |
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| Online Erişim: | Click here to view the full text content |
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