Factors governing tin whisker growth /
Tin (Sn) whiskers are electrically conductive, single crystal eruptions that grow from Sn film surfaces. Their high aspect ratio presents reliability problems for the electronics industry due to bridging and metal arcing, leading to malfunctions and catastrophic failures in many electronic systems (...
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| Format: | eBook |
| Language: | English |
| Published: |
Cham
Springer International Publishing
2013.
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| Series: | Springer Theses, Recognizing Outstanding Ph.D. Research
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| Online Access: | Click here to view the full text content |
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