Electromigration modeling at circuit layout level /
Integrated circuit (IC) reliability is of increasing concern in present-day IC technology where the interconnect failures significantly increases the failure rate for ICs with decreasing interconnect dimension and increasing number of interconnect levels. Electromigration (EM) of interconnects has...
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| Format: | eBook |
| Language: | English |
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Singapore
Springer Singapore
2013.
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| Series: | SpringerBriefs in Applied Sciences and Technology
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| Online Access: | Click here to view the full text content |
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