APA (7th ed.) Citation

Tan, C. M., & He, F. (2013). Electromigration modeling at circuit layout level. Springer Singapore.

Chicago Style (17th ed.) Citation

Tan, Cher Ming, and Feifei He. Electromigration Modeling at Circuit Layout Level. Singapore: Springer Singapore, 2013.

MLA (8th ed.) Citation

Tan, Cher Ming, and Feifei He. Electromigration Modeling at Circuit Layout Level. Springer Singapore, 2013.

Warning: These citations may not always be 100% accurate.