Power-constrained testing of VLSI circuits /
Saved in:
Main Author: | |
---|---|
Other Authors: | |
Format: | Book |
Language: | English |
Published: |
Boston
Kluwer
c2003
|
Series: | Frontiers in electronic testing ;
|
Subjects: | |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Physical Description: | xi, 178 pages: illustrations; 25 cm. |
---|---|
Bibliography: | Includes bibliographical references (p. 163-173) |
ISBN: | 140207235X |