Power-constrained testing of VLSI circuits /

Power-constrained testing of VLSI circuits /

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Bibliographic Details
Main Author: Nicolici, Nicola (Author)
Other Authors: Al-Hashimi, Bashir M.
Format: Book
Language:English
Published: Boston Kluwer c2003
Series:Frontiers in electronic testing ;
Subjects:
Integrated circuits, very large scale integration > Protection.
Integrated circuits > Very large scale integration > Testing.
Semiconductors > Thermal properties.
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Description
Physical Description:xi, 178 pages: illustrations; 25 cm.
Bibliography:Includes bibliographical references (p. 163-173)
ISBN:140207235X

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