Power-constrained testing of VLSI circuits /

Power-constrained testing of VLSI circuits /

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Библиографические подробности
Главный автор:	Nicolici, Nicola (Автор)
Другие авторы:	Al-Hashimi, Bashir M.
Формат:	‌
Язык:	English
Опубликовано:	Boston Kluwer c2003
Серии:	Frontiers in electronic testing ;
Предметы:	Integrated circuits, very large scale integration > Protection. Integrated circuits > Very large scale integration > Testing. Semiconductors > Thermal properties.
Метки:	Добавить метку Нет меток, Требуется 1-ая метка записи!

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